PVD (Physical Vapor Deposition)
Evaporator
- Thermal Evaporator
- E-beam Evaporator
- Ion Beam Assisted Deposition
- Arc Suppression E-beam Evaporator
- Pulsed Laser Deposition
Sputter
- RF & DC Magnetron
- Ion Beam Sputter
- UHV Sputter
- In Line Sputter
- Bench Top Sputter
Solar Cell
• CVD (Chemical Vapor Deposition)
PECVD
RTP (Rapid Thermal Process)
• Etcher
ICP (Inductively Coupled Plasma)
RIE (Reactive Ion Etching)
CAIBE (Chemically
   Assisted Ion Beam Etching)
Atmospheric Plasma
Vacuum Dryer
 
 
home > product > Etcher > ICP (Inductively Coupled Plasma)
RMET series
RMET-i4000L Series
- Fully automated vacuum process
  control system
- Process chamber &
  Loadlock chamber
RMET-i2000L Series
- Semi-automated vacuum process
  control system
- Process chamber &
  Loadlock chamber
RMET-i2000 Series
- Semi-automated vacuum process
  control system
- Process chamber only
  (single chamber system)

Introduction

An Inductively Coupled Plasma (ICP) is a type of plasma source in which the energy is supplied by electrical currents which are produced by electromagnetic induction, that is, by time-varying magnetic fields.
In its simplest form, an inductively coupled plasma consists of a vacuum vessel, into which the gas to be ionized is administered, and an induction coil, driven by a source of RF power. The coil is generally separated from the vacuum region by a dielectric window. The wide range of applications for RF driven, inductively driven plasma sources has been recently expanded in processing tools for coating or etching system in the microelectronics industry.

Features

- R&D system configuration
- Substrate size is available for 2~6 inch dia.
- 13.56MHz RF power
- Process chamber with Al anodized chamber
- He Backside cooling & Bias & Chiller -20?~50?
- ICP source with plasma spiral coil
Etching : Etch Uniformity

• Etch uniformity : 1.06 ± % within3” wafer
• Etch rate : 1.16µm/min

    Center         Top       Bottom         Left         Right
Before removing metal mask
53.62µm   53.61µm   52.51µm   53.93µm   52.79µm
After removing metal mask
52.59µm   52.79µm   51.68µm   52.57µm   51.88µm

Si Etching : Etch Profile

GaN Etching in Cl2 / BCI3 Plasma : Etch Profiles
• GaN etch rate : >350mm/min

Specification

Item Specification
System configuration R&D
Substrate size 2” ~ 6” inches
Operating pressure (Torr) 5 ~ 50 mTorr
Uniformity within substrate / ±5% max.
substrate to substrate surfaces
Power & Bias Power 13.56 MHz RF power
Process Chamber Al anodized Chamber
Substrate He Backside cooling & Bias & Chiller -20°C~50°C
Ultimate Pressure < 1X10-6 Torr
ICP Source Plasma Spiral Coil